Cary Universal Measurement Accessory (UMA)
Delivering a turn-key solution for research, development, and QA/QC in optics, thin films/coatings, solar, and glass, the Cary UMA will advance your materials analysis. Experience the same measurement flexibility and productivity as the Cary 7000 universal measurement spectrophotometer (UMS) on your existing Cary 4000, 5000, or 6000i today.
- UV-Vis & UV-Vis-NIR Accessories
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Product Details
- Achieve complete sample characterization
- Measure absolute reflection and transmission in a single sequence—at variable angle and s or p polarization—without moving or disturbing the sample
- Measure diffusely scattered transmission and reflection with the freedom to control detector and sample position independently
- Utilize the huge sample chamber to accommodate all sample types—from small to large—delivering 360 degrees of rotational flexibility
- Obtain complete control of beam collimation and patch size to best suit your sample and measurement needs
- Lower your cost-per-analysis, saving you time and money
- Measure in minutes what other systems take hours to days to complete—with unattended automation
- Simply set up your method, collect a single baseline, insert one or more samples, and walk away
- Obtain the highest quality results fast with the next-generation Cary WinUV software
- The Cary WinUV software features a new method editor for simple method setup, advanced data processing, and 3D graphics, ensuring fast and accurate data analysis
- Application Notes
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Performance of compact visual displays — measuring angular reflectance of optically active materials using the Agilent Cary 7000 Universal Measurement Spectrophotometer (UMS)
Application note for Performance of compact visual displays — measuring angular reflectance of optically active materials using the Agilent Cary 7000 Universal Measurement Spe
- Application Notes
- English
- 09 Jul 2013
- 464.71 KB
Optical characterization of thin films using a new Universal Measurement Accessory for the Agilent Cary UV-Vis-NIR spectrophotometers
Application note for Optical characterization of thin films using a new Universal Measurement Accessory for the Agilent Cary UV-Vis-NIR spectrophotometers
- Application Notes
- English
- 09 Jul 2013
- 289.05 KB
Automated, unattended multi-angle transmission and absolute reflection measurements on architectural and automotive glass using the Agilent Cary 7000 Universal Measurement Spectrophotometer (UMS)
Application note for Automated, unattended multi-angle transmission and absolute reflection measurements on architectural and automotive glass using the Agilent Cary 7000 UMS
- Application Notes
- English
- 08 Jul 2013
- 1.22 MB
Quality control of beam splitters and quarter-wave-mirrors
How to do multi-angle UV-Vis-NIR measurements of multiple layer optical coatings
- Application Notes
- English
- 15 Apr 2020
- 773.24 KB
High volume optical component testing using an Agilent Cary 7000 Universal Measurement Spectrophotometer (UMS) with Solids Autosampler
Application note for High volume optical component testing using an Agilent Cary 7000 Universal Measurement Spectrophotometer (UMS) with Solids Autosampler
- Application Notes
- English
- 13 Mar 2020
- 564.25 KB
Coated Wafer Mapping Using UV-Vis Spectral Reflection and Transmission Measurements
Using an Agilent Cary 7000 Universal Measurement Spectrophotometer (UMS) with Solids Autosampler
- Application Notes
- English
- 17 Feb 2020
- 486.92 KB
A faster, more accurate way of characterizing cube beamsplitters using the Agilent Cary 7000 Universal Measurement Spectrophotometer (UMS)
Application note for A faster, more accurate way of characterizing cube beamsplitters using the Agilent Cary 7000 Universal Measurement Spectrophotometer (UMS)
- Application Notes
- English
- 08 Jul 2013
- 533.47 KB
Investigating the angular dependence of absolute specular refl ection using the Agilent Cary 7000 Universal Measurement Spectrophotometer (UMS)
Application note for Investigating the angular dependence of absolute specular reflection using the Agilent Cary 7000 UMS
- Application Notes
- English
- 08 Jul 2013
- 1.00 MB
Gaining deeper insights into thin film response-overcoming spectral oscillations using the Cary Universal Measurement Accessory
Application note for Gaining deeper insights into thin film response — overcoming spectral oscillations using the Cary Universal Measurement Accessory
- Application Notes
- English
- 08 Jul 2013
- 384.03 KB
- Flyers
- Technical Overviews
- Supplemental Information
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Cary Universal measurement Accessory (UMA) Solids Autosampler
Revolutionize your materials analysis with the Agilent Solids Autosampler for the Cary UMA.