
Agilent 5800 ICP-OES
5800 ICP-OES
No other inductively coupled plasma - optical emission spectrometer (ICP-OES) can give you this level of insight into both your samples and instrument health, so let the 5800 ICP-OES, with the powerful ICP Expert software, help you to get the right result, first time, every time.
- ICP-OES Instruments
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Product Details
- IntelliQuant smart software, providing expert level knowledge to identify spectral interferences that can affect accuracy, providing recommendations allowing you to quickly select the best wavelength and preventing unnecessary remeasurement
- Early Maintenance Feedback (EMF), utilizing over 100 sensors that monitor and track instrument health, alerting the analyst when maintenance is needed, overcoming common reasons for service calls, reducing expense and wasted time
- Smart tools such as Fitted Background Correction (FBC), Fast Automated Curve-fitting Technique (FACT) and Inter Element Correction (IEC) to simplify method development when dealing with both routine and complex samples
- Neb Alert, continuously monitoring the nebulizer and alerting you when the nebulizer is leaking or needs cleaning, preventing wasted time and the cost of troubleshooting
- Vertical Dual View (VDV), offering flexibility between viewing modes to avoid interferences, enhancing the sensitivity and the linear dynamic measurement range
- Vertically oriented torch design, reducing cleaning downtime and ensuring fewer replacement torches
- Advanced freeform optical design, resulting in a small footprint, saving valuable bench space, reducing warm up and purge times and reducing the cost of ownership
- Key Literature
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Elemental Analysis of Brine Samples used for Lithium Extraction
Fast, robust analysis of high matrix samples using the Agilent 5800 ICP-OES with AVS 7 switching valve
- Application Notes
- English
- 04 Aug 2022
- 873.47 KB
Analysis of Rare Earth Elements in Base Metal Ores by ICP-OES
In this study, the common complex spectral interferences experienced when measuring REEs were overcome using an Agilent 5800 VDV ICP-OES
- Application Notes
- English
- 31 Jan 2022
- 1.36 MB
Fast and Robust Analysis of Various Types of Waters by ICP-OES Following Method HJ 776-2015
This application note shows how the Agilent 5800 ICP-OES reduces the sample measurement time for environmental water samples using Chinese method HJ 776-2015. The instrument’s smart tools also reduce maintenance requirements, further increasing lab productivity
- Application Notes
- English
- 10 Aug 2021
- 970.45 KB
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Read Reviews of the 5800 ICP-OES
Explore customer reviews posted on SelectScience, or write your own review.
August Meng
Principle Engineer, American Battery Technology Company
We are using the Agilent 5800 ICP-OES to support our primary battery metal extraction and lithium-ion battery recycling projects. The 5800 ICP-OES and its sensitive axial view enables dependable trace impurity analyses. The Vertical Dual View package allows us to consistently and accurately quantify target analytes (Li, Ni, Co and Mn) as well as trace element impurities with high salt concentration in the matrix. Trace impurity analysis of battery metals is critical as these impurities (e.g., Fe, Zn) significantly affect the performance and safety of lithium-ion batteries.
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New Application Note: Simplify complex method development with IntelliQuant Screening
Find out how Agilent ICP-OES can use the power of IntelliQuant Screening and multiple background correction techniques to simplify method development and improve the accuracy of your results. Find out how a smartICP can make your analysis more efficient.
- 04 May 2022
New Application Note: Less Than a Minute per Sample for HJ 776-2015 Water Analysis by ICP-OES
Discover how the 5800 ICP-OES can take productivity to the next level for the analysis of a range of water samples, whilst still meeting the demands of the Chinese method HJ 776-2015.
- 01 Oct 2021
New Lithium-ion battery Information page
A new resource for anyone involved in, or considering, the analysis of lithium-ion battery samples by ICP-OES is now available. All the relevant information is brought together in one convenient location, and even includes a free, on demand webinar. Check it out now and ensure you are overcoming the challenges of this complex application.
- 27 Aug 2021