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FTIR 仪器和成像系统备件

FTIR 仪器和成像系统备件

利用 FTIR 进行外部反射测量需要使用参比样品进行背景测量。参比样品呈盘状,安装于反射探头的顶端。

提供多种参考背景盖,每种参考背景盖设计用于处理不同类型的采样界面和测量样品

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