产品详细信息
特性
- 钻石晶体 ATR 接口是分析固体、液体、糊状物和凝胶的理想选择。
- 漫反射采样接口适用于分析各种样品,包括艺术品、土壤、岩石和矿物、复合材料、未经加工的塑料、织物和金属表面的腐蚀物。
- 镜面发射接口可分析反射金属(如铝和钢铁)表面的薄膜和镀膜。入射角度为 45 度。
- 掠角反射接口的入射角为 82 度,使其成为分析非常薄(亚微米)的薄膜的理想选择。Ge 晶体 ATR 接口(由锗晶体构成)非适合分析高吸光性固体和液体样品。
资料库
- 重要资料
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Agilent 4300 Handheld FTIR Spectrometer Brochure
At-site. Immediate results. True non-destructive analysis. Perform accurate, non-destructive material testing with the Agilent 4300 Handheld FTIR.
- 产品样本
- English
- 2014 年 3 月 1 日
- 4.56 MB
Non-Destructive Analysis of Substrates and Contaminants by FTIR Specular Reflectance
Agilent 4300 handheld FTIR spectrometer with specular reflectance identifies substrate materials, evaluates presence of contaminants, quantifies contaminants.
- 应用简报
- English
- 2023 年 5 月 24 日
- 2.13 MB
Comparison of Portable FTIR Techniques for the Analysis of Paints, Minerals & Concrete
ATR, Diffuse Reflectance and 45 degree specular reflectance FTIR spectroscopy measurements were compared for paint, concrete and rock samples.
- 应用简报
- English
- 2017 年 8 月 21 日
- 1.25 MB
- 产品样本
- 目录
技术支持
- 常见问题解答
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- 补充信息
工具
视频
培训与活动
Spectroscopy Digital Workshops & Bootcamps
Hone your lab skills, outside the lab, with our live, interactive series of virtual workshops and software bootcamps! Learn about the latest in software solutions for Spectroscopy, discuss the entire analytical process from method development to data analysis, and participate in live analytical runs with our experts. We hope these will prepare you for future hands-on events in the future.
网络研讨会/培训
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