4300 手持式 FTIR 采样附件
为应对多种应用,系统具有可瞬间更换的五种不同的采样接口,各种接口以各自的特定方式将光线传递到样品。这些接口具有射频识别 (RFID) 功能,实现采样接口与具体软件方法的无缝集成。
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- 钻石晶体 ATR 接口是分析固体、液体、糊状物和凝胶的理想选择。
- 漫反射采样接口适用于分析各种样品,包括艺术品、土壤、岩石和矿物、复合材料、未经加工的塑料、织物和金属表面的腐蚀物。
- 镜面发射接口可分析反射金属(如铝和钢铁)表面的薄膜和镀膜。入射角度为 45 度。
- 掠角反射接口的入射角为 82 度,使其成为分析非常薄(亚微米)的薄膜的理想选择。Ge 晶体 ATR 接口(由锗晶体构成)非适合分析高吸光性固体和液体样品。
反射 FTIR 光谱
反射 FTIR 用于从固体样品中获得高质量的光谱数据。镜面反射用于反射表面,漫反射 (DRIFTS) 用于较粗糙、反射较少的表面(通常为粉末),掠角反射吸收 FTIR 用于测量亚微米薄膜和表面污染物。
Learn More- Key Literature
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Agilent 4300 Handheld FTIR Spectrometer Brochure
At-site. Immediate results. True non-destructive analysis. Perform accurate, non-destructive material testing with the Agilent 4300 Handheld FTIR.
- Brochures
- English
- 18 Feb 2025
- 7.24 MB
Non-Destructive Analysis of Substrates and Contaminants by FTIR Specular Reflectance
Agilent 4300 handheld FTIR spectrometer with specular reflectance identifies substrate materials, evaluates presence of contaminants, quantifies contaminants.
- Application Notes
- English
- 24 May 2023
- 2.13 MB
Comparison of Portable FTIR Techniques for the Analysis of Paints, Minerals & Concrete
ATR, Diffuse Reflectance and 45 degree specular reflectance FTIR spectroscopy measurements were compared for paint, concrete and rock samples.
- Application Notes
- English
- 21 Aug 2017
- 1.25 MB
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使用手持式直接漫反射 FTIR 光谱分析锂矿石
一份新的应用简报评估了使用手持式 4300 FTIR 在直接 DRIFTS 模式下快速、直接且无损地鉴别岩石。无需挖掘或将样品运送到实验室即可识别潜在的锂矿开采地点。只需将设备对准目标岩石进行分析,然后与地质材料数据库进行比对,或使用定量模型来确定岩石中的矿物含量。
- 04 Nov 2024