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841 - 860 of 21613 results
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Effective removal of tungsten-based interferences on five Hg isotopes using MS/MS
Low-ppt determination of alkali metals in high matrix samples using the optional "m-lens"
| Chinese (Simplified) (China) | Complete (PDF) |
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Agilent 8900 and ICP-MS MassHunter software module simplify spICP-MS analysis
| Chinese (Simplified) (China) | Complete (PDF) |
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Routine determination of inorganic As in less than two minutes
Online MSA calibration using prepFAST S automated sample introduction and Agilent 8900 ICP-QQQ
| Chinese (Simplified) (China) | Complete (PDF) |
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Compound structure-independent quantificatio of drugs
A modified US FDA EAM Method §4.10 was used to determine the organic As species (DMA & MMA) and the more toxic inorganic forms in wine using HPLC coupled to a ICP-QQQ
| Korean (Korea) | Complete (PDF) |
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5188-6564, ICP-MS Stock Tuning Solution (100 mL), Lot 3-167MSBY2, Certificate of Analysis
Routine analysis of trace and major elements in high matrix food digest samples
| Korean (Korea) | Complete (PDF) |
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| Chinese (Simplified) (China) | Complete (PDF) |
ICP-MS Simulator Installation Guide Rev.2.0
The performance of the 8900 ICP-QQQ for the analysis of some of the most challenging elements for ICP-MS: phosphorus, sulfur, silicon, and chlorine
| Chinese (Simplified) (China) | Complete (PDF) |
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Using MS/MS capability of the 8900 ICP-QQQ to overcome challenging spectral overlap in the analysis of nanoparticles.
| Korean (Korea) | Complete (PDF) |
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| Chinese (Simplified) (China) | Complete (PDF) |
Meet the growing demand for elemental speciation and confidence determine both levels and chemical forms with Agilent speciation columns and supplies.
| Chinese (Simplified) (China) | Complete (PDF) |
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Fully integrated solution increases productivity of environmental labs
Accurate, precise, and stable results in a basalt sample matrix with the Agilent 7850 ICP-MS in helium collision mode
| Japanese (Japan) | Complete (PDF) |
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In this study, we evaluated the performance of the Agilent 8900 ICP-QQQ to determine key analytes in three simulated precursor materials in semiconductor manufacturing.
| Japanese (Japan) | Complete (PDF) |
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| Chinese (Simplified) (China) | Complete (PDF) |
| Korean (Korea) | Complete (PDF) |
Elemental profiling using an Agilent 7850 ICP-MS and Agilent Mass Profiler Professional (MPP) software
Discriminating Geographical Origin of Soybeans using ICP-MS and Chemometrices Software
A guide to the applications of ICP-MS in the semiconductor industry, including the control of metal contaminants.
| Chinese (Simplified) (China) | Complete (PDF) |
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