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1321 - 1340 of 26885 results
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A simple, streamlined, and safe analysis of petrochemical samples using and Agilent 4210 MP-AES
| Russian (Russia) | Complete (PDF) |
|---|
A study of the use of Agilent’s MP-AES instrument as a high performance, low cost and safe technique for analysing metals in base metal ores
| Russian (Russia) | Complete (PDF) |
|---|
Microwave Plasma Atomic Emission Spectroscopy (MP-AES) Application eHandbook
Learn how the FACT Spectral Deconvolution Software does real-time spectral correction of complex samples
Simple sample preparation and streamlined analysis as per ASTM method D8322
The VGA 77 Vapor Generation Accessory is ideal for rapid trace level determinations of mercury and other hydride-forming elements at parts-per-billion (μg/L) concentrations.
Quality control measurement of 12 elements in lithium hexafluorophosphate
Quality assured results per ISO 15151 method using the Agilent 5800 ICP-OES with smart tools
Using the smart features of the Agilent 5800 VDV ICP-OES to simplify method development and quality assure the results
Evaluation of an Agilent 5110 ICP-OES for the quality control of vegetable oils
A study using an Agilent 5800 Radial View ICP-OES method in accordance with ISO 22241-2 standard
| Japanese (Japan) | Complete (PDF) |
|---|---|
| Korean (Korea) | Complete (PDF) |
A brief overview of how to improve accuracy when using ASTM D5185-18 to determine 22 elements in used and unused lubricating and base oils
Low-cost method using the Agilent 4210 MP-AES with AVS 4 switching valve in accordance with Brazilian regulations
| Portuguese (Brazil) | Complete (PDF) |
|---|---|
| Japanese (Japan) | Complete (PDF) |
Using an Agilent 5800 Radial View ICP-OES and the ASTM D5185-18 standard method
| Spanish (Mexico) | Complete (PDF) |
|---|
Simplify method development and improve confidence in results with the Agilent 5800 VDV ICP-OES and IntelliQuant Screening
Accurate determination of Ni and V, using an Agilent 5110 VDV ICP-OES according to ASTM D5708-15 test method
Agilent 5800 VDV ICP-OES provides smart tools to streamline method development and improve confidence in the results
Agilent’s Fitted Background Correction (FBC) takes the guesswork out of background correction. No matter what your sample challenge may be.
A technical overview of how the SVDV optical system works and the benefits it delivers.
Evaluating an Agilent Easy-fit fully demountable ICP-OES torch for oil analysis, according to ASTM D5185-18
| Chinese (Simplified) (China) | Complete (PDF) |
|---|---|
| Korean (Korea) | Complete (PDF) |
| Japanese (Japan) | Complete (PDF) |