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It’s here! Announcing...

VTEP v2.0 Powered, with Cover-Extend Technology

Get test coverage without test access

Agilent has announced its latest limited access solution that does exactly this.
Cover-Extend technology is part of the  Agilent Medalist VTEP v2.0 Powered test suite that brings to the fore-front your solution to counter test challenges today. Imagine the benefits of having test coverage on your PCBA without needing physical test access on each node. You'll be able to:

• decrease your cost of PCBA material;
• decrease your cost of fixturing;
• decrease your cost of test resources;
• speed up your design time;
• allow a denser board design with more features;
• reduce solder joint damage due to strain
• ...the list goes on.
  

This new solution will draw its strength from two of the most well-known technologies in In-Circuit Testing - Boundary Scan and VTEP, which Agilent has 20 years of experience in.

What is VTEP v2.0 Powered?

Today's test challenges demand fast and reliable measurements. Not only that, it has to cater to limited access challenges, partly from ever-shrinking board geometries and increasingly higher on-board signals.

VTEP v2.0 Powered rises to the challenge providing test coverage without need of direct test access and with capability extending to ultra-low measurement IC pins (less than 5fF) and even power and ground pins which are crucial in High Speed Signal Propagation. It's your solution for coverage of integrated circuits, sockets, connectors and more in a limited-access environment.

VTEP v2.0 Powered is a suite of vectorless test solutions which is built upon the original Medalist VTEP technology and now enhanced with Cover-Extend technology following the inclusion of Network Parameter Measurement technology and the award-winning Medalist iVTEP. Bringing these solutions together into VTEP v2.0 Powered means having the best vectorless test in your hands.

VTEP v2.0 Powered test suite comprises :

• VTEP
• iVTEP
• Network Parameter Measurement
• Cover-Extend

VTEP

The core to Medalist VTEP v2.0 is the original Medalist VTEP engine.

The VTEP hardware is 4X more sensitive and up to 5X better in standard deviation than its predecessor, Testjet. The Autodebug function with per-pin-threshold characterization enables debugging in seconds.

iVTEP
This award-winning* focuses on ultra low value measurement of signal pins (< 5fF) of ICs. Targeting ultra small IC packages, flip chips and devices with minimal or no lead frame at all, iVTEP even works with ICs with non-grounded heatspreaders and heatsinks.

^{* Best in Test Award 2007, Test & Measurement World}

Network Parameter Measurement technology
An industry first, Network Parameter Measurement* technology detects defects on power and ground pins. Currently available for connectors, this capability enables coverage that could otherwise escape even functional test.

^{* EM Asia Innovation Award, 2008}

Benefits
Best-in-class coverage

• more than 90% of signal pins
• ICs with heat-spreaders and heatsinks*
• power and ground connector pins

Improved test stability
Decreased test-time-per-pin
Compatible with existing VTEP hardware

^{*Non-grounded}

Cover-Extend

Latest technology in this suite enabling test coverage without test access.

Requirements

Hardware
VTEP hardware listed here :

VTEP Products	Description
N4300A	Signal Conditioning MUX Card (Qty : 10)
N4301A	Probe Active Electronics (Qty : 50)
N4302A	1.2 Inch Passive Sensor Plate (Qty : 100)
N4303A	2.5 Inch Passive Sensor Plate (Qty : 50)
N4306A	0.5 X 6.0 Passive Sensor Plate (Qty : 50)
N4307A	Connect Check Mux Card (Qty : 10)
N4311A	Small Probes (Qty : 50)
N4312A	Small Probes (Qty : 250)
N4313A	Probes (Qty : 250)

VTEP Products
Description
Additional hardware needed to enable Cover-Extend capability.

Software
Medalist i3070 software ver.07.20p and above

New NPM Connector Library File Request
NPM requires a library file of the connector that user wants to test. To request for a library file for a new connector not currently in your ICT software, please click here.