In-circuit Test > Agilent Medalist i1000

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The Agilent Medalist i1000 in-circuit test (ICT) system is a low-cost solution for manufacturers who need 'just-enough tests'. Unlike manufacturing defects analyzer test systems and other ICT systems that employ older generation TestJet technology pioneered by Agilent, the Medalist i1000 offers the cutting-edge Agilent VTEP v2.0 Powered vectorless test suite, comprising the award-winning iVTEP and Network Parameter Measurement technologies. These enable unparalleled coverage of micro ball grid arrays and flip chips, as well as power and ground pins for connectors, commonly found in digital consumer products and desktops PCs.

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  • U9401A Medalist i1000 P
    The U9401A is a cost effective in-circuit test (ICT) system that provides users with an affordable option which accepts a typical MDA-type fixture with cable connections.
  • U9402A Medalist i1000 S
    The U9402A is an affordable in-circuit test (ICT) system that employs a vacuum type fixture and a mechanical fixture lock-down system using electrical motors.