Agilent | N3231A: IC-CAP User Training

3 Days · Lecture and Lab · Where & When · Advantages of Agilent Training

Audience: Device modelers and anyone who needs to understand the use of IC-CAP for modeling.

This 3-day course will show students how to define measurements and data; use basic analysis tools in IC-CAP, including Parameter Extraction Language (PEL), built-in functions and extractions, simulation and optimization; how to automate modeling tasks with macros; and how to use other simulators with IC-CAP, such as the Advanced Design System. A measurement exercise will familiarize students with the steps involved in working with a measurement system.

What you will Learn

Navigate though the IC-CAP user interface
Drive measurement systems from IC-CAP to collect data
Extract model parameters from the measured data
Simulate the model and compare results to measured data
Optimize model parameters to match measured results
Read files in and out of IC-CAP
Introduction of PEL (Parameter Extraction Language) to automate IC-CAP
Import data from IC-CAP into the Advanced Design System
Use Advanced Design System models and simulator for IC-CAP
Learn how to use User-Defined Models with IC-CAP

Prerequisites

Knowledge of measurement and modeling concepts and techniques
N3211A: Advanced Design System Fundamentals
N3231A: IC-CAP User Training

Outline

DAY ONE
- Modeling and IC-CAP Fundamentals
- Hardware, Measurements, and Extractions
- Simulation and Optimization
DAY TWO
- Introduction to PEL
- Extraction Methods: BJT Example
- Automated Extraction
DAY THREE
- The NMOS Model
- The IC-CAP Studio Interface
- Advanced Features
- ADS and IC-CAP
- Data Management and Data I/O in IC-CAP

Where & When

Read Terms & Conditions

Prices shown are list prices and are subject to change without notice

Education & Training Materials

Data Sheet: IC-CAP User Training Datasheet
A 2-page, B & W, course overview for IC-CAP User Training. Contains specifications of the course including length, format, delivery, prerequisites, and agenda.

2002-10-10

66 KB

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