Portable Impulse Response Models for Signal Integrity Applications

This webcast is based on a paper first presented at DesignCon 2008 Conference. It was one of only ten papers from among the eighty-eight presented at DesignCon that were honored with the IEC DesignCon Paper Award.

In the signal integrity industry, S-parameters have become the most commonly distributed models for simulating passive components. Because S-parameters are frequency-domain values, many signal integrity engineers are finding it difficult to accurately implement these parameters in time-domain simulations. Addressing transient convolution specifically, this paper shows the need for a new impulse response model and proposes a methodology for its inclusion in time-domain simulations. The paper also solves another difficult problem by presenting a new technique for converting band-limited S-parameters into ‘base-delay’ causal and passive impulse response models that preserve accuracy to the maximum frequency of the original S-parameters.

Who should view this Webcast
This webcast will benefit high-speed serial link designers and signal integrity engineers who use S-parameter and impulse response interconnect models.

Where & When

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