Accurate and Efficient Contaminant Analysis in Silicon Wafer Manufacturing
Agilent instruments, incorporating a new generation of ultimate sensitivity technology, are helping semiconductor manufacturers measure and minimize contamination at every level of the production process. Our 7700 ORS technology, and the industry-leading 8800 ICP-MS/MS instrument, precisely and efficiently measure the type, source, and level of metallic impurities during each stage of wafer fabrication, in even the highest matrix environments.
Detecting trace contaminants efficiently is important in order to maintain manufacturing yields, and our automated sample handling and data processing tools help ensure this. Chemical analysis is also carried out in a direct process ensuring a reduced risk of contamination during testing. In addition, all equipment is backed up by Agilent’s exceptional support structure for silicon wafer fabricators delivered by experienced engineers.