Superior Sensitivity and Contamination Control of Trace Level Impurities
As the size of semiconductors in integrated circuits continues to shrink, the impacts of trace level contaminants, particularly metals, on manufacturing yields is growing. Only instruments such as Agilent's 8800 Triple Quadrupole ICP-MS and 7900 ICP-MS are able to provide the high levels of sensitivity needed to examine the purity, particulates and packaging of semiconductors effectively.
Our new generation of Ultimate Sensitivity technology is leading the way in contamination control, with the Cary 600 series FTIR and ExoScan also enabling surface and shallow impurity detection. Our solutions enable the direct analysis of chemicals, eliminating dilution and sample contamination issues, and are supported by a comprehensive suite of sample handling, automation tools, and an unrivaled support structure for semiconductor users.