Skip to main content

Components Analysis

Increase Yield with Impurity Analysis That is Sensitive, Reliable and Robust

Accurately detecting impurities in semiconductor manufacturing materials is vital to ensure component quality and yield. As modern semiconductors get smaller potential negative effects on component speed and profitability are increasing, and matrix interference is also having an impact on effective detection of metal.

Agilent's reliable and easy to use range of ICP-MS, ICP-OES and FTIR systems are pushing the boundaries of efficient semiconductor impurity analysis, ensuring that manufacturers of a wide variety of materials can maintain output quality. The 7900 ICP-MS and 8800 ICP-QQQ have the precision to detect trace metals at industry-leading levels of sensitivity, whilst the Cary 600 Series and ExoScan FTIR systems analyze shallow impurities effectively. Automation solutions also ensure increased efficiency and robust performance.