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Highly Precise Specialty Film & Coatings Analysis

Thin film manufacturers and providers require analysis solutions that are highly precise but can be implemented efficiently enough to enable a high level of ongoing quality control that doesn’t impact on throughput. Thin films are widely used as optical coatings and in semiconductors, and require high transmission and reflectance quality and control, depending on the application.

For superior thin film analysis the Cary-7000-Universal-Measurement-Spectrophotometer-(UMS) measures both transmission and reflectance from exactly the same point, eliminating systematic errors due to different measurement angles and locations. Thin film applications and quality control processes significantly benefit from the high precision and consistent multi-angle spectrophotometric performance of the Cary 7000 UMS, particularly in multi-layer applications, with data collection automated for greater efficiency.