Agilent Technologies 2010/11 Award Wins

Industry Awards

Frost and Sullivan

• Global Microwave Test Equipment Product Line Strategy of the Year, 2010
• Customer Value Enhancement, Test and Measurement category, 2010
• Market-Share Leadership in Global Wireless Test Equipment, 2011
• Global Arbitrary Waveform Generators Enabling Technology Award, 2011
  

Instrument Business Outlook (IBO)

• 2010 Company of the Year, Agilent Technologies, Inc.

Trade Publication Product Award Winners

China Annual Creativity in Electronics (ACE) Awards 2011 Test & Measurement Product of the Year

• Infiniium 90000 X-Series oscilloscopes

Design News Golden Mousetrap Best Product  2011

• Electronics, Test & Measurement category, winner
  N6781A 2-Quadrant Source/Measure Unit for Battery Drain Analysis
• Test and Measurement, finalists: 
  M9018A PXI Chassis, M9392A vector signal analyzer,      M9502A and M9505A   AXIe Chassis and PXI/AXIe product launch,  M9202A PXI Express IF digitizer
  

Electronic Design Magazine

• Best Electronic Design award for 2011 in Test & Measurement,                             
  M8190A arbitrary waveform generator
• Best Electronic Design award for 2010 in the Test & Measurement, oscilloscope category
  Infiniium 90000 X-Series

Electronic Products, China 2010 Product of the Year

• Infiniium 90000 X-Series oscilloscopes

Electronic Products Magazine

• Product of the Year - PXI/AXIe Modular Product launch

Elektroniknet Magazine, top 111 product finalist

• AXIe/PXI Modular Products

ElectroniqueS Magazine

• Electron d'Or Award, Instrumentation category - Infiniium 90000 X-Series oscilloscope

EDN Hot 100 Products 2010  

• N9342C HSA 100-kHz to 7-GHz handheld spectrum analyzer
• 86100D DCA-X (extended) wide-bandwidth equivalent-time-sampling oscilloscope
• N6781A source-measure unit for battery-drain analysis
• 81180A 4.2G-sample/sec arbitrary-waveform generator

EDN INNOVATION AWARD 2010

• Innovator of the year, finalist
  Infiniium Oscilloscopes design team
• Power Supplies, finalist
  N6781A two-quadrant source/measure unit for battery-drain analysis
• Test and Measurement Systems and Boards, winner
  PXI and AXIe test portfolio

2011 EDN China Innovation Award for the Best Test and Measurement Product

• Infiniium 2000 / 3000 X- Series Oscilloscopes

2010 EDN China Innovation Award for the Best Test and Measurement Product

• Infiniium 90000 X- Series Oscilloscopes

ElectroniqueS Magazine, Electron d'Or Award, Instrumentation category

•  Infiniium 90000 X-Series oscilloscope

Elektra 2010, the European Electronics Industry Awards, Test Product of the Year

• Infiniium 90000 X-Series oscilloscopes

2011 EM Asia Innovation Awards

• Test Equipment, winner
  M9186A - PXI-based versatile voltage/current source measurement module

Fifth SMT China Vision Awards

• Inspection and Testing – ICT, winner
  M9186A - PXI-based versatile voltage/current source measurement module

R&D Magazine 2011 Awards

• Electronic Instrumentation
  Infiniium 90000 X-Series oscilloscopes

Test and Measurement World 2011 Best in Test

• Instruments, Modular, winner
  M9018A PXI Chassis
• RF/Microwave Test, winner
  M9392A PXI Vector Signal Analyzer
• Instruments, Modular, finalists
  M9502A and M9505A AXIe Chassis
• Oscilloscopes, finalist
  Infiniium 90000 X-Series

Test and Measurement World 2011 Test of Time

• Model 3070/i3070 In-Circuit Tester, winner

Test & Measurement World's Top 50 of 2011

• ATE/DFT/BIST
  TS-8900 PXI-based automotive functional test system
• Communications Test
  8990B RF peak-power analyzer
  N4903B J-BERT bit-error-rate tester
  W1918 LTE-Advanced baseband verification library
• Electrical and Physical Environmental Test
  N9038A MXE EMI receiver
• Instrumentation
  81160A pulse function arbitrary noise generator
  B2912A precision source-measure unit
  PrecisionProbe oscilloscope software

Special Awards/Recognitions

EE Times Top 50 articles of 2010

• Probing hints for accurate, repeatable power-supply measurements,  Jae-Yong Chang

Informa LTE North America 2010 award, individual contribution to LTE development.

• Moray Rumney, the lead technologist specializing in LTE

Autotestcon 2010 David M. Goodman Best Paper Award,  Management Topics

• The Real Total Cost of Ownership of Your Test Equipment, Bill Lycette and Duane Lowenstein

IEEE Fellow, field of optical measurement and sensing

• Doug Baney, a leader in one of Agilent's advanced research laboratories