Agilent Technologies Launches Unique X-ray Detectors with Smart Sensitivity Control
New Approach Measures Diffraction Invisible to Previous Detectors
SANTA CLARA, Calif., Aug. 26, 2013
Agilent Technologies Inc. (NYSE: A) today launched a range of unique X-ray Diffraction CCD Detectors with Smart Sensitivity Control. The Eos S2, Atlas S2 and Titan S2 CCD detectors offer active areas of 92 mm, 135 mm and 165 mm, respectively, and automatically adapt their sensitivity based on the strength of the diffraction from the sample being studied.
"Smart Sensitivity Control is very similar to adjusting the ISO setting in digital photography," said Leigh Rees, Agilent's XRD general manager. "SSC is part of our Intelligent Measurement System, which also includes the ability to instantly switch hardware-binning modes. This allows the detectors to automatically adjust both sensitivity and dynamic range based on how strong or weak the diffraction is. This unique approach means we're measuring diffraction data invisible to previous detectors, in faster experiment times and with higher overall data quality."
Single-crystal X-ray diffraction systems are used for routine analytical chemistry and challenging small-molecule and protein-diffraction studies. The S2 CCDs are the latest detectors from Agilent, which has a 20-year history of designing and manufacturing specialist detectors for single crystal X-ray diffraction.
The detectors will be on display at the European Crystallography Meeting now under way at the University of Warwick. For more information on the conference, visit www.ecm28.org.
About Agilent Technologies
Agilent Technologies Inc. (NYSE: A) is the world's premier measurement company and a technology leader in chemical analysis, life sciences, diagnostics, electronics and communications. The company's 20,500 employees serve customers in more than 100 countries. Agilent had revenues of $6.9 billion in fiscal 2012. Information about Agilent is available at www.agilent.com.
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