SANTA CLARA, Calif., June 8, 2011
Agilent Technologies Inc. (NYSE: A) today announced the latest wave of X-parameter innovations designed to further advance their use and support the industry's rapidly increasing interest in the technology.
"X-parameters are a fast-moving technology, and we continue to invest heavily to advance nonlinear measurements and characterization," said Gregg Peters, vice president and general manager of Agilent's Component Test Division. "Within a short period of time, we have built up a solid base of industry-leading customers and partners. This is an exciting area for us and is an example of our long-term belief that there is a unique synergy between our instruments and our Agilent EEsof software products. "
Agilent's latest X-parameter innovations include the following:
This announcement is timed in concert with the International Microwave Symposium, being held this week in Baltimore, Md. Agilent's X-parameter innovations will be showcased in Booth 813, along with demonstrations of the NVNA, ADS 2011, Genesys and SystemVue solutions. In addition, two MicroApp papers will be presented. Agilent's Dr. Loren Betts will also serve as a panelist at the Microwave Journal Nonlinear Characterization Expert MicroApp Forum.
About Agilent EEsof EDA Software
Agilent EEsof EDA is the leading supplier of electronic design automation software for microwave, RF, high-frequency, high-speed digital, RF system, electronic system level, circuit, 3-D electromagnetic, physical design and device-modeling applications. More information is available at www.agilent.com/find/eesof.
About Agilent Technologies
Agilent Technologies Inc. (NYSE: A) is the world's premier measurement company and a technology leader in chemical analysis, life sciences, electronics and communications. The company's 18,500 employees serve customers in more than 100 countries. Agilent had net revenues of $5.4 billion in fiscal 2010. Information about Agilent is available at www.agilent.com.
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